簡要描述:FilmTek 2000SE光譜型橢偏儀以非常低的成本為薄膜應(yīng)用提供了的測量性能和速度。FilmTek SE提供了自動(dòng)測量薄膜厚度、折射率和消光系數(shù)的功能,非常適合學(xué)術(shù)和研發(fā)。
產(chǎn)品分類
Product Category相關(guān)文章
Related Articles詳細(xì)介紹
價(jià)格區(qū)間 | 面議 | 產(chǎn)地類別 | 進(jìn)口 |
---|
Measurement Features | FilmTek™ 2000SE / 3000SE |
Index of Refraction折射率 | ±0.0002 |
Thickness Measurement Range 膜厚范圍 | 1Å-200µm |
Maximum Spectral Range (nm) 大光譜范圍 | 190-1700 |
Standard Spectral Range (nm) 標(biāo)準(zhǔn)光譜范圍 | 240-1000 |
Reflection 反射 | Yes |
Transmission 透射 | Yes (3000) |
Spectroscopic Ellipsometry 光譜橢圓分析法 | Yes |
Power Spectral Density | Yes |
Multi-angle Measurements (DPSD) | Yes |
TE & TM Components of Index | No |
Multi-layer thickness | Yes |
Index of Refraction | Yes |
Extinction (absorption) Coefficient | Yes |
Energy band gap | Yes |
Composition | Yes |
Crystallinity | Yes |
Inhomogeneous Layers | Yes |
Surface Roughness | Yes |
產(chǎn)品咨詢
歡迎您加我微信了解更多信息
微信掃一掃